The course is targeted to basic testing techniques, design for testability methods of digital circuits and systems. Key words: defects, fault models, test pattern generation algorithms, fault simulation techniques, design for testability, bult-in self-test and fault tolerant systems.
The course is targeted to advanced design for testability and built-in self-testing techniques, testability standards and alterantive testing techniques digital circuits, techniques and problems of system on chip (SoC) testing. Key words: SoC, memories, processors, bult-in self-test, built-in self-repair, reconfiguration, low power, test overhead.
The course is targeted to principles and parameters of reliable digital systems design, methods of design quality, dependability of digital circuits and systems. Key words: reliability, fault-tolerant and fail-safe digital systems, design quality measurements, six sigma.
The course is targeted to research problems in computer system fields for preparing students to work on their thesis, to learn about research projects solved at the faculty, to works with electronic library databases, to find resources for solving thesis and to present research results at conferencies, journals, etc.